This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2015, 6, 404–413, doi:10.3762/bjnano.6.40
Figure 1: SEM images taken from (a) bare Ag NP deposited on Si/SiOx substrates with tAg = 0.8 nm (given in eq...
Figure 2: (a) STEM–HAADF image of Ag NPs, (b) atomically resolved TEM image of a single NP, revealing crystal...
Figure 3: (a) Sketch of the geometry for the SDR experiments showing the incidence angle, Θ, and the system u...
Figure 4: (a) SDR spectra of bare Ag NPs deposited on Si/SiOx, tAg = 0.8 nm, taken under p-polarisation at di...
Figure 5: (a) SDR spectra taken under p-polarisation excitation at Θ = 30° on Ag NPs deposited on Si/SiOx aft...
Beilstein J. Nanotechnol. 2015, 6, 60–67, doi:10.3762/bjnano.6.7
Figure 1: Sketch of the experimental set up: the NPs are created by the NC200 source (A), they are mass selec...
Figure 2: SEM images of NPs films: NPs diameter 6 nm (a), NPs diameter 9 nm (lateral size distribution in the...
Figure 3: STEM (a) and HRTEM (b) images of ceria NPs corresponding to the sample with average diameter of 9 n...
Figure 4: (a) Ce 3d XPS spectra and corresponding fit of the 9 nm sample acquired at 40 W, in the bottom regi...
Figure 5: (a) Ce 3d XPS spectra for a complete reduction (black curves) and oxidation (red curve) cycle. (b) ...
Figure 6: STM images of a cerium oxide ultrathin film on Pt(111) (a) as grown, acquired at 2.0 V and 0.03 nA,...